发明名称 接合構造体
摘要 A bonded structure 106 includes a semiconductor element 102 bonded to a Cu electrode 103 with a bonding material 104 predominantly composed of Bi, wherein the semiconductor element 102 and the Cu electrode 103 are bonded to each other via a laminated body 209a that progressively increases a Young's modulus from the bonding material 104 to a bonded material (the semiconductor element 102 and the Cu electrode 103), achieving stress relaxation against a thermal stress generated in a temperature cycle during the use of a power semiconductor module.
申请公布号 JP5723225(B2) 申请公布日期 2015.05.27
申请号 JP20110125656 申请日期 2011.06.03
申请人 パナソニック株式会社;石原ケミカル株式会社 发明人 中村 太一;北浦 秀敏;吉澤 章央
分类号 H01L21/52;B23K1/00;B23K1/20 主分类号 H01L21/52
代理机构 代理人
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