发明名称 METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DETECTING ELECTRICAL DISCONNECTION BETWEEN INTEGRATED CIRCUIT CHIP ELECTRICAL CONNECTIONS AND CORRESPONDING ELECTRICAL CONTACTS ON A PRINTED CIRCUIT BOARD OR CHIP SOCKET DURING TESTING OF THE CHIP UNDER ENVIRONMENTAL CONDITIONS
摘要 A method for detecting electrical disconnections of a chip during testing under environmental conditions includes providing n monitor connections on a chip from which a voltage or current can be sensed during testing of the chip under environmental conditions, where n is an integer of at least one. M sensing connections are provided on the chip, where m>n. An electrical circuit for electrically connects the n monitor connections with the m sensing connections. The electrical circuit has a characteristic that changes when one or more of the m sensing connections is disconnected from its corresponding contact on the printed circuit board or chip socket. The electrical circuit is monitored via the n monitor connections during the testing. It is determined based on changes in the characteristic, whether one or more of the m sensing connections is disconnected from the printed circuit board or chip socket.
申请公布号 US2015355261(A1) 申请公布日期 2015.12.10
申请号 US201414299665 申请日期 2014.06.09
申请人 SanDisk Technologies Inc. 发明人 Tubul Shai;Bassin Evgeni;Romanov Victor
分类号 G01R31/04 主分类号 G01R31/04
代理机构 代理人
主权项 1. A method for detecting electrical disconnection between integrated circuit chip electrical connections and corresponding electrical contacts on a printed circuit board or a chip socket during testing of the chip under environmental conditions, the method comprising: providing n monitor connections on an integrated circuit (IC) chip from which a voltage or current can be sensed during the testing of the chip under the environmental conditions, n being an integer of at least one; providing m sensing connections on the chip, the m sensing connections for connecting to the printed circuit board or chip socket during the testing of the chip under the environmental conditions, m being an integer greater than n; providing an electrical circuit for electrically connecting the n monitor connections with the m sensing connections, the electrical circuit having a characteristic that changes when one or more of the m sensing connections is disconnected from its corresponding contact on the printed circuit board or chip socket; and testing the chip, monitoring, via the n monitor connections, the circuit during the testing, and identifying, based on changes in the characteristic, whether one or more of the m sensing connections is disconnected from the printed circuit board or chip socket.
地址 Plano TX US