发明名称 試験システム
摘要 A server stores multiple configuration data. A tester hardware is configured to be capable of changing at least a part of its functions according to configuration data stored in rewritable nonvolatile memory, to supply a power supply voltage to a DUT, to transmit a signal to the DUT, and to receive a signal from the DUT. An information technology equipment is configured such that, (i) when the test system is set up, the information technology equipment acquires the configuration data from the server according to the user's input, and writes the configuration data to the nonvolatile memory. Furthermore, the information technology equipment is configured such that, (ii) when the DUT is tested, the information technology equipment executes a test program so as to control the tester hardware, and to process data acquired by the tester hardware.
申请公布号 JP5833500(B2) 申请公布日期 2015.12.16
申请号 JP20120127523 申请日期 2012.06.04
申请人 株式会社アドバンテスト 发明人 木村 学;渡辺 利明;鈴木 武久
分类号 G01R31/28;G01R31/26 主分类号 G01R31/28
代理机构 代理人
主权项
地址