| 发明名称 | Display substrate, method of manufacturing the same and display apparatus having the same | ||
| 摘要 | A display substrate includes a base substrate including a display area and a peripheral area surrounding the display area, a switching element in the display area, a main-test-line in the peripheral area, extending in the second direction and electrically connected with a data line, a sub-test-line in the peripheral area, and a test pad in the peripheral area and electrically connected with the main-test-line and the sub-test-line. The switching element is electrically connected with a gate line extending in a first direction and the data line extending in a second direction crossing the first direction. The sub-test-line is electrically connected with the data line. The sub-test-line is in a different layer from the main-test-line. | ||
| 申请公布号 | US9214401(B2) | 申请公布日期 | 2015.12.15 |
| 申请号 | US201414312912 | 申请日期 | 2014.06.24 |
| 申请人 | SAMSUNG DISPLAY CO., LTD. | 发明人 | Yoo Dong-Hyun;Lee Seong-Young;Kim Jae-Won;Park Hyung-Jun |
| 分类号 | G02F1/13;H01L21/66;H01L27/12;H01L21/3213;G02F1/1368;G02F1/1362 | 主分类号 | G02F1/13 |
| 代理机构 | Cantor Colburn LLP | 代理人 | Cantor Colburn LLP |
| 主权项 | 1. A display substrate comprising: a base substrate comprising a display area, and a peripheral area surrounding the display area; a gate line extending in a first direction, and a data line extending in a second direction crossing the first direction; a switching element in the display area and electrically connected with the gate line and the data line; a main-test-line in the peripheral area, extending in the second direction and electrically connected with the data line; a sub-test-line in the peripheral area, electrically connected with the data line, and in a different layer from the main-test-line; and a test pad electrically in the peripheral area and connected with the main-test-line and the sub-test-line. | ||
| 地址 | KR | ||