发明名称 Testing system and testing method for touch device
摘要 A testing system for a touch device includes a touch simulation module, a control module and a determination module is provided. The touch simulation module includes multiple conductive elements respectively corresponding to multiple touch sensing regions of the touch device. The control module selectively provides a testing signal to one or multiple of the conductive elements. The determination module determines whether the touch device correctly responds a testing that the control module provides to the device under testing through the touch simulation module.
申请公布号 US9213057(B2) 申请公布日期 2015.12.15
申请号 US201313962990 申请日期 2013.08.09
申请人 MStar Semiconductor, Inc. 发明人 Chen Chien-Chuan;Ho Kai-Ting;Huang Yu-Chien
分类号 G01R31/28;G06F3/041;G01R31/312 主分类号 G01R31/28
代理机构 Edell, Shapiro & Finnan, LLC 代理人 Edell, Shapiro & Finnan, LLC
主权项 1. A touch device testing system for testing a touch device, comprising: a touch simulation module, comprising a plurality of conductive elements respectively corresponding to a plurality of touch sensing regions of the touch device, each conductive element spanning all sensing regions of the touch device along a predetermined axis; a control module, coupled to the conductive elements, for generating and selectively providing a testing signal to one or a plurality of conductive elements among the conductive elements; and a determination module, coupled to the touch device, for determining whether the touch device correctly responds to a testing that the control device applies to the touch sensing regions through the touch simulation module, wherein the plurality of conductive elements cause capacitances changes in the plurality of touch sensing regions in response to the testing signal.
地址 Hsinchu Hsien TW