METHOD AND APPARATUS FOR INSPECTING APPEARANCE OF ELECTRONIC APPLIANCE

摘要

The present invention relates to a method and an apparatus to inspect an appearance of an electronic product. To achieve the objective of the present invention, the method to inspect the appearance of an electronic product comprises: a step of generating an obtained image by photographing an image of an electronic product to be inspected using a camera; a step of comparing a comparing area of a pre-stored reference image with a comparing area of the obtained image; and a step of determining that a target component contained in the comparing area is abnormal if a difference between the comparing area of the reference image and the comparing area of the obtained image is above a predetermined range as the result of the comparison. The present invention has an advantage of correctly and quickly inspecting an appearance of an electronic product on which a small component is mounted through an image obtained through a camera.