发明名称 BACKSIDE SOURCE-DRAIN CONTACT FOR INTEGRATED CIRCUIT TRANSISTOR DEVICES AND METHOD OF MAKING SAME
摘要 An integrated circuit transistor is formed on and in a substrate. A trench in the substrate is at least partially filed with a metal material to form a source (or drain) contact buried in the substrate. The substrate further includes a source (or drain) region epitaxially grown above the source (or drain) contact. The substrate further includes a channel region adjacent to the source (or drain) region. A gate dielectric is provided on top of the channel region and a gate electrode is provided on top of the gate dielectric. The substrate is preferably of the silicon on insulator (SOI) type.
申请公布号 US2015357477(A1) 申请公布日期 2015.12.10
申请号 US201414298000 申请日期 2014.06.06
申请人 STMicroelectronics, Inc. 发明人 Zhang John Hongguang;Kleemeier Walter
分类号 H01L29/786;H01L27/12 主分类号 H01L29/786
代理机构 代理人
主权项 1. An integrated circuit transistor, comprising: a substrate including an insulating layer and an overlying semiconductor layer, the substrate including a trench extending into the insulating layer; a metal material at least partially filling the trench in the insulating layer to form a source contact buried in the substrate, said source contact having a top surface; a source region formed by the overlying semiconductor layer and in electrical contact with the source contact, said source region having a bottom surface in physical contact with the top surface of the source contact; a channel region in the overlying semiconductor layer adjacent the source region; a gate dielectric on top of the channel region; and a gate electrode on top of the gate dielectric.
地址 Coppell TX US