发明名称 |
BACKSIDE SOURCE-DRAIN CONTACT FOR INTEGRATED CIRCUIT TRANSISTOR DEVICES AND METHOD OF MAKING SAME |
摘要 |
An integrated circuit transistor is formed on and in a substrate. A trench in the substrate is at least partially filed with a metal material to form a source (or drain) contact buried in the substrate. The substrate further includes a source (or drain) region epitaxially grown above the source (or drain) contact. The substrate further includes a channel region adjacent to the source (or drain) region. A gate dielectric is provided on top of the channel region and a gate electrode is provided on top of the gate dielectric. The substrate is preferably of the silicon on insulator (SOI) type. |
申请公布号 |
US2015357477(A1) |
申请公布日期 |
2015.12.10 |
申请号 |
US201414298000 |
申请日期 |
2014.06.06 |
申请人 |
STMicroelectronics, Inc. |
发明人 |
Zhang John Hongguang;Kleemeier Walter |
分类号 |
H01L29/786;H01L27/12 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. An integrated circuit transistor, comprising:
a substrate including an insulating layer and an overlying semiconductor layer, the substrate including a trench extending into the insulating layer; a metal material at least partially filling the trench in the insulating layer to form a source contact buried in the substrate, said source contact having a top surface; a source region formed by the overlying semiconductor layer and in electrical contact with the source contact, said source region having a bottom surface in physical contact with the top surface of the source contact; a channel region in the overlying semiconductor layer adjacent the source region; a gate dielectric on top of the channel region; and a gate electrode on top of the gate dielectric. |
地址 |
Coppell TX US |