发明名称 General protection of an integrated circuit against permant overloads and electrostatic discharges
摘要 In an integrated circuit, a diode is interposed between the semiconductor substrate and the contact pad to an external bias voltage, and the substrate is biased at an internal voltage reference. Between each contact pad of the integrated circuit and semiconductor substrate, there is positioned a protection device against permanent overloads and a protection device against electrostatic discharges. By isolating the semiconductor substrate from the external voltages source and by placing a protection device between each contact pad and the substrate, a broad, general protection of the integrated circuit is obtained against all the destructive phenomena such as overloads, positive and negative overvoltages, polarity reversal and electrostatic discharges.
申请公布号 US7288450(B1) 申请公布日期 2007.10.30
申请号 US19990790504 申请日期 1999.11.30
申请人 STMICROELECTRONICS S.A. 发明人 TAILLIET FRANCOIS
分类号 H01L21/8238;H01L27/02 主分类号 H01L21/8238
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