发明名称 |
Method for manufacturing a semiconductor device comprising transistors each having a different effective work function |
摘要 |
The method for manufacturing a semiconductor device comprising transistors each having a different work function arranged along a main surface of a substrate, comprising:
- providing at least two channel regions in the substrate;
- providing a dielectric layer on the substrate;
- providing openings in the dielectric layer thereby providing corresponding gate regions on the channel regions;
- providing a gate dielectric layer in the openings on the gate regions;
- providing on the gate dielectric layer on each of the gate regions a barrier layer stack having different thickness along the different gate regions;
- providing a gate filling stack of metal layers on the barrier layer stack in each of the gate regions;
wherein providing the barrier layer stack comprises:
- providing a first barrier layer on the gate dielectric layer in the openings on each of the gate regions;
- selectively removing the first barrier layer in a subset of the gate regions, leaving the first barrier layer on at least a complementary subset of the gate regions;
and repeating at least once the step of:
- providing a subsequent barrier layer in the openings on each of the channel regions;
- selectively removing the subsequent barrier layer in a respective subset of the channel regions, leaving the respective subsequent barrier layer in a respective complementary subset of the channel regions; such that barrier layer stacks having different thickness along different gate regions are provided. |
申请公布号 |
EP2953162(A1) |
申请公布日期 |
2015.12.09 |
申请号 |
EP20140171559 |
申请日期 |
2014.06.06 |
申请人 |
IMEC VZW |
发明人 |
RAGNARSSON, LARS-AKE;SCHRAM, TOM;DEKKERS, HENDRIK F.W.;CHEW, SOON AIK |
分类号 |
H01L21/8234;H01L21/8238 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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