发明名称 Method for manufacturing a semiconductor device comprising transistors each having a different effective work function
摘要 The method for manufacturing a semiconductor device comprising transistors each having a different work function arranged along a main surface of a substrate, comprising: - providing at least two channel regions in the substrate; - providing a dielectric layer on the substrate; - providing openings in the dielectric layer thereby providing corresponding gate regions on the channel regions; - providing a gate dielectric layer in the openings on the gate regions; - providing on the gate dielectric layer on each of the gate regions a barrier layer stack having different thickness along the different gate regions; - providing a gate filling stack of metal layers on the barrier layer stack in each of the gate regions; wherein providing the barrier layer stack comprises: - providing a first barrier layer on the gate dielectric layer in the openings on each of the gate regions; - selectively removing the first barrier layer in a subset of the gate regions, leaving the first barrier layer on at least a complementary subset of the gate regions; and repeating at least once the step of: - providing a subsequent barrier layer in the openings on each of the channel regions; - selectively removing the subsequent barrier layer in a respective subset of the channel regions, leaving the respective subsequent barrier layer in a respective complementary subset of the channel regions; such that barrier layer stacks having different thickness along different gate regions are provided.
申请公布号 EP2953162(A1) 申请公布日期 2015.12.09
申请号 EP20140171559 申请日期 2014.06.06
申请人 IMEC VZW 发明人 RAGNARSSON, LARS-AKE;SCHRAM, TOM;DEKKERS, HENDRIK F.W.;CHEW, SOON AIK
分类号 H01L21/8234;H01L21/8238 主分类号 H01L21/8234
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