发明名称 磁界測定装置
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a magnetic field measurement device capable of measuring a magnetic field in a small area in a space and capable of enhancing the measurement sensitivity of the magnetic field. <P>SOLUTION: The magnetic field measurement device includes: a first conductor wire 11 provided along a first loop L<SB POS="POST">1</SB>forming a part of a current path of an induction current flowing due to changes of a magnetic flux penetrating the first loop L<SB POS="POST">1</SB>; a second conductor wire 12 provided along the first loop L<SB POS="POST">1</SB>forming a part of the current path; and a conductor 17 provided along the first loop L<SB POS="POST">1</SB>forming a part of the current path being connected to each of the first conductor wire 11 and the second conductor wire 12. Each of the parts of the first conductor wire 11 and the second conductor wire 12 is provided along the second loop L<SB POS="POST">2</SB>which is smaller than the first loop L<SB POS="POST">1</SB>to form a part of the current path of the induction current which flows due to changes of the magnetic flux penetrating the second loop L<SB POS="POST">2</SB>. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5831085(B2) 申请公布日期 2015.12.09
申请号 JP20110205775 申请日期 2011.09.21
申请人 富士通株式会社 发明人 永井 利明
分类号 G01R33/02 主分类号 G01R33/02
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