发明名称 自動分析装置
摘要 <p>Provided is an automatic analysis device including a light scattering photometer incorporated therein, the automatic analysis device having improved analysis accuracy by reducing the influences from external light and that can be used safely with good operability. An automatic analysis device includes a scattered light measurement unit disposed inside the main-body casing, and openable/closable protective covers 610 to 630 to cover the top face 410 of the main-body casing. The first protective cover 610 at the center includes a light-shielding part to block external light. The protective covers include see-through parts 621, 631 enabling seeing therethrough of inside. The light-shielding part is configured to cover an area of the reaction disk at least corresponding to the area above the scattered light measurement unit, thus reducing external light leaking into the scattered light measurement unit, and thus removing influences from external light on the scattered light measurement. The protective cover may have a two-divided structure or may include one protective cover, other than the three-divided structure.</p>
申请公布号 JP5828728(B2) 申请公布日期 2015.12.09
申请号 JP20110213151 申请日期 2011.09.28
申请人 株式会社日立ハイテクノロジーズ 发明人 大沼 満;佐藤 庸子;山崎 創;和久井 章人
分类号 G01N35/02;G01N21/47 主分类号 G01N35/02
代理机构 代理人
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