发明名称 |
Self-aligned fine pitch permanent on-chip interconnect structures and method of fabrication |
摘要 |
An interconnect structure and methods for making the same include sidewall portions of an interlevel dielectric layer. The sidewall portions have a width less than a minimum feature size for a given lithographic technology and the width is formed by a thickness of the interlevel dielectric layer when conformally formed on vertical surfaces of a mandrel. The sidewall portions form spaced-apart openings. Conductive structures fill the spaced-apart openings and are separated by the sidewall portions to form single damascene structures. |
申请公布号 |
US9209126(B2) |
申请公布日期 |
2015.12.08 |
申请号 |
US201213606788 |
申请日期 |
2012.09.07 |
申请人 |
GLOBALFOUNDRIES INC. |
发明人 |
Lin Qinghuang;Mehta Sanjay;Shobha Hosadurga |
分类号 |
H01L23/522;H01L23/532;H01L21/768 |
主分类号 |
H01L23/522 |
代理机构 |
Tutunjian & Bitetto, P.C. |
代理人 |
Tutunjian & Bitetto, P.C. |
主权项 |
1. An interconnect structure for an integrated circuit device, comprising:
a plurality of sidewall portions of an interlevel dielectric layer, the sidewall portions having a width less than a minimum feature size for a given lithographic technology and the width being formed by a thickness of the interlevel dielectric layer when conformally formed on vertical surfaces of a mandrel, the sidewall portions forming spaced-apart openings; and conductive structures filling the spaced-apart openings and separated by the sidewall portions to form single damascene structures, wherein the conductive structures are the interconnects to semiconductor devices in a substrate that the interlevel dielectric layer is present on, wherein each interface between the interconnects and the plurality of sidewall portions is planar. |
地址 |
Grand Cayman KY |