发明名称 Self-aligned fine pitch permanent on-chip interconnect structures and method of fabrication
摘要 An interconnect structure and methods for making the same include sidewall portions of an interlevel dielectric layer. The sidewall portions have a width less than a minimum feature size for a given lithographic technology and the width is formed by a thickness of the interlevel dielectric layer when conformally formed on vertical surfaces of a mandrel. The sidewall portions form spaced-apart openings. Conductive structures fill the spaced-apart openings and are separated by the sidewall portions to form single damascene structures.
申请公布号 US9209126(B2) 申请公布日期 2015.12.08
申请号 US201213606788 申请日期 2012.09.07
申请人 GLOBALFOUNDRIES INC. 发明人 Lin Qinghuang;Mehta Sanjay;Shobha Hosadurga
分类号 H01L23/522;H01L23/532;H01L21/768 主分类号 H01L23/522
代理机构 Tutunjian & Bitetto, P.C. 代理人 Tutunjian & Bitetto, P.C.
主权项 1. An interconnect structure for an integrated circuit device, comprising: a plurality of sidewall portions of an interlevel dielectric layer, the sidewall portions having a width less than a minimum feature size for a given lithographic technology and the width being formed by a thickness of the interlevel dielectric layer when conformally formed on vertical surfaces of a mandrel, the sidewall portions forming spaced-apart openings; and conductive structures filling the spaced-apart openings and separated by the sidewall portions to form single damascene structures, wherein the conductive structures are the interconnects to semiconductor devices in a substrate that the interlevel dielectric layer is present on, wherein each interface between the interconnects and the plurality of sidewall portions is planar.
地址 Grand Cayman KY