发明名称 Semiconductor device and manufacturing method thereof
摘要 A method of manufacturing a WLP semiconductor structure includes several operations. One of the operations is providing a carrier and the carrier includes a top surface. One of the operations is covering a portion of the top surface with a plurality of active dies. One of the operations is disposing a protrudent band on a periphery of the carrier, wherein the protrudent band includes a rim shaped along the contour of the carrier. One of the operations is forming a molding compound on the carrier to cover the plurality of active dies.
申请公布号 US9209046(B2) 申请公布日期 2015.12.08
申请号 US201314044490 申请日期 2013.10.02
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. 发明人 Liu Yu-Chih;Huang Chang-Chia;Lin Shih-Yen;Chen Chin-Liang;Ho Kuan-Lin;Lin Wei-Ting
分类号 H01L21/00;H01L21/56;H01L23/31 主分类号 H01L21/00
代理机构 WPAT, P.C. 代理人 WPAT, P.C. ;King Anthony
主权项 1. A method of manufacturing a device, comprising: providing a carrier including a top surface; covering a portion of the top surface with a plurality of active dies; covering a central region of the carrier with a molding compound, wherein a first portion of the plurality of active dies are under the molding compound; and covering a periphery of the carrier with a periphery molding compound over a peripheral region of the carrier, the periphery molding compound has a CTE differing from a CTE of the molding compound, and wherein a second portion of the plurality of active dies are under the periphery molding compound, wherein the first portion of the plurality of active dies is a first predetermined set of the plurality of the active dies, and the second portion of the plurality of active dies is a second predetermined set of the plurality of the active dies other than the first predetermined set of the plurality of the active dies.
地址 Hsinchu TW