发明名称 |
Semiconductor device and manufacturing method thereof |
摘要 |
A method of manufacturing a WLP semiconductor structure includes several operations. One of the operations is providing a carrier and the carrier includes a top surface. One of the operations is covering a portion of the top surface with a plurality of active dies. One of the operations is disposing a protrudent band on a periphery of the carrier, wherein the protrudent band includes a rim shaped along the contour of the carrier. One of the operations is forming a molding compound on the carrier to cover the plurality of active dies. |
申请公布号 |
US9209046(B2) |
申请公布日期 |
2015.12.08 |
申请号 |
US201314044490 |
申请日期 |
2013.10.02 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
发明人 |
Liu Yu-Chih;Huang Chang-Chia;Lin Shih-Yen;Chen Chin-Liang;Ho Kuan-Lin;Lin Wei-Ting |
分类号 |
H01L21/00;H01L21/56;H01L23/31 |
主分类号 |
H01L21/00 |
代理机构 |
WPAT, P.C. |
代理人 |
WPAT, P.C. ;King Anthony |
主权项 |
1. A method of manufacturing a device, comprising:
providing a carrier including a top surface; covering a portion of the top surface with a plurality of active dies; covering a central region of the carrier with a molding compound, wherein a first portion of the plurality of active dies are under the molding compound; and covering a periphery of the carrier with a periphery molding compound over a peripheral region of the carrier, the periphery molding compound has a CTE differing from a CTE of the molding compound, and wherein a second portion of the plurality of active dies are under the periphery molding compound, wherein the first portion of the plurality of active dies is a first predetermined set of the plurality of the active dies, and the second portion of the plurality of active dies is a second predetermined set of the plurality of the active dies other than the first predetermined set of the plurality of the active dies. |
地址 |
Hsinchu TW |