发明名称 Method of making a die with recessed aluminum die pads
摘要 A method for making a semiconductor device comprises forming an electrical interconnect layer, forming a first dielectric layer over the interconnect layer, forming an opening in the first dielectric layer over a first electrical interconnect of the interconnect layer, forming an aluminum layer over the first dielectric layer, etching the aluminum layer to form an aluminum die pad, forming a second dielectric layer over the aluminum die pad and the first dielectric layer, and forming a conductive via through the first and second dielectric layers to contact a second electrical interconnect of the interconnect layer.
申请公布号 US9209078(B2) 申请公布日期 2015.12.08
申请号 US201414230875 申请日期 2014.03.31
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 Spencer Gregory S.;Crabtree Philip E.;Denning Dean J.;Junker Kurt H.;Martin Gerald A.
分类号 H01L23/48;H01L33/62;H01L21/768;H01L21/3105;H01L23/00;H01L23/488 主分类号 H01L23/48
代理机构 代理人 Dolezal David G.
主权项 1. A method for making a semiconductor device comprising: forming an electrical interconnect layer; forming a first dielectric layer over the electrical interconnect layer; forming an opening in the first dielectric layer over a first interconnect of the electrical interconnect layer; forming an aluminum layer over the opening and the first dielectric layer; patterning the aluminum layer to form an aluminum die pad electrically coupled to the first interconnect of the electrical interconnect layer; forming a second dielectric layer with a planar surface over the aluminum die pad and the first dielectric layer, wherein the planar surface is at least 0.1 micron above a top surface of the aluminum die pad; forming a conductive via through the first dielectric layer and the second dielectric layer to electrically contact a second interconnect of the electrical interconnect layer; after forming the conductive via, forming an opening in the second dielectric layer to expose at least a portion of the aluminum die pad, wherein the top surface of the aluminum die pad is at a level that is below a top surface of the conductive via.
地址 Austin TX US