发明名称 Silicon-based tunneling field effect transistors and transistor circuitry employing same
摘要 A p-channel tunneling field effect transistor (TFET) is selected from a group consisting of (i) a multi-layer structure of group IV layers and (ii) a multi-layer structure of group III-V layers. The p-channel TFET includes a channel region comprising one of a silicon-germanium alloy with non-zero germanium content and a ternary III-V alloy. An n-channel TFET is selected from a group consisting of (i) a multi-layer structure of group IV layers and (ii) a multi-layer structure of group III-V layers. The n-channel TFET includes an n-type region, a p-type region with a p-type delta doping, and a channel region disposed between and spacing apart the n-type region and the p-type region. The p-channel TFET and the n-channel TFET may be electrically connected to define a complementary field-effect transistor element. TFETs may be fabricated from a silicon-germanium TFET layer structure grown by low temperature (500 degrees Centigrade) molecular beam epitaxy.
申请公布号 US9209285(B2) 申请公布日期 2015.12.08
申请号 US201013496542 申请日期 2010.09.13
申请人 THE OHIO STATE UNIVERSITY 发明人 Berger Paul R.
分类号 H01L27/092;H01L29/739 主分类号 H01L27/092
代理机构 Fay Sharpe LLP 代理人 Fay Sharpe LLP
主权项 1. An electronic device or circuit comprising: a p-channel tunneling field-effect transistor (p-channel TFET) comprising a multi-layer structure including: an n-type source region,a p-type drain region,a channel region disposed between and spacing apart the n-type source region and the p-type drain region, anda conduction band quantum well at an interface between the n-type source region and the channel region; wherein the p-channel TFET is selected from a group consisting of (i) a multi-layer structure of group IV layers includes with the channel region comprising a silicon-germanium alloy with non-zero germanium content and (ii) a multi-layer structure of group III-V layers with the channel region comprising a ternary III-V alloy.
地址 Columbus OH US