发明名称 |
Method of fabricating nitride semiconductor light emitting device |
摘要 |
A method of fabricating a nitride semiconductor light emitting device is provided. The method includes growing a first group-III-nitride semiconductor layer on a substrate, the first group-III-nitride semiconductor layer having a top surface formed as a group-III-rich surface exhibiting a group-III-polarity and a bottom surface formed as a N-rich surface exhibiting a N-polarity. The method further includes selectively etching a N-polarity region in the top surface of the first group III nitride semiconductor layer, forming a second group III nitride semiconductor layer on the first group III nitride semiconductor layer to fill the etched N-polarity region and forming a light emitting structure including first and second conductivity type nitride semiconductor layers and an active layer on the second group III nitride semiconductor layer. |
申请公布号 |
US9209349(B2) |
申请公布日期 |
2015.12.08 |
申请号 |
US201414184171 |
申请日期 |
2014.02.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Lee Kee Won;Seo Jong Uk;Yoon Suk Ho;Lee Keon Hun;Lee Sang Don |
分类号 |
H01L21/00;H01L33/00;H01L21/02;H01L33/32;H01L33/12;H01L33/16 |
主分类号 |
H01L21/00 |
代理机构 |
McDermott Will & Emery LLP |
代理人 |
McDermott Will & Emery LLP |
主权项 |
1. A method of fabricating a nitride semiconductor light emitting device, the method comprising:
growing a first group III nitride semiconductor layer on a substrate, the first group III nitride semiconductor layer having a top surface formed as a group III rich surface exhibiting a group III polarity and a bottom surface formed as a N-rich surface exhibiting a N-polarity; selectively etching an N-polarity region in the top surface of the first group III nitride semiconductor layer; forming a second group III nitride semiconductor layer on the first group III nitride semiconductor layer to fill the etched N-polarity region; and forming a light emitting structure on the second group III nitride semiconductor layer, the light emitting structure including a first conductivity type nitride semiconductor layer, an active layer, and a second conductivity type nitride semiconductor layer. |
地址 |
Suwon-Si, Gyeonggi-Do KR |