发明名称 Method of fabricating nitride semiconductor light emitting device
摘要 A method of fabricating a nitride semiconductor light emitting device is provided. The method includes growing a first group-III-nitride semiconductor layer on a substrate, the first group-III-nitride semiconductor layer having a top surface formed as a group-III-rich surface exhibiting a group-III-polarity and a bottom surface formed as a N-rich surface exhibiting a N-polarity. The method further includes selectively etching a N-polarity region in the top surface of the first group III nitride semiconductor layer, forming a second group III nitride semiconductor layer on the first group III nitride semiconductor layer to fill the etched N-polarity region and forming a light emitting structure including first and second conductivity type nitride semiconductor layers and an active layer on the second group III nitride semiconductor layer.
申请公布号 US9209349(B2) 申请公布日期 2015.12.08
申请号 US201414184171 申请日期 2014.02.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Lee Kee Won;Seo Jong Uk;Yoon Suk Ho;Lee Keon Hun;Lee Sang Don
分类号 H01L21/00;H01L33/00;H01L21/02;H01L33/32;H01L33/12;H01L33/16 主分类号 H01L21/00
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A method of fabricating a nitride semiconductor light emitting device, the method comprising: growing a first group III nitride semiconductor layer on a substrate, the first group III nitride semiconductor layer having a top surface formed as a group III rich surface exhibiting a group III polarity and a bottom surface formed as a N-rich surface exhibiting a N-polarity; selectively etching an N-polarity region in the top surface of the first group III nitride semiconductor layer; forming a second group III nitride semiconductor layer on the first group III nitride semiconductor layer to fill the etched N-polarity region; and forming a light emitting structure on the second group III nitride semiconductor layer, the light emitting structure including a first conductivity type nitride semiconductor layer, an active layer, and a second conductivity type nitride semiconductor layer.
地址 Suwon-Si, Gyeonggi-Do KR