发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To increase carrier life time.SOLUTION: A semiconductor device manufacturing method includes: a process of forming a semiconductor layer 12 containing barium silicide on a substrate 10; and a process of forming a barium layer or a silicon layer 14 on the semiconductor layer 12 without exposing a surface of the semiconductor layer 12 in an oxidation atmosphere. A semiconductor device comprises: a semiconductor layer 12 including a barium silicide formed on a substrate 10; and a surface layer 14 which is formed on the semiconductor layer 12, and has an atom ratio of barium against barium and silicon, which is larger than the atom ratio in the semiconductor layer and includes barium oxide (or has an atom ratio of silicon against barium and silicon, which is larger than the atom ratio in the semiconductor layer and includes silicon oxide). |
申请公布号 |
JP2015220371(A) |
申请公布日期 |
2015.12.07 |
申请号 |
JP20140103670 |
申请日期 |
2014.05.19 |
申请人 |
UNIV OF TSUKUBA;NAGOYA UNIV |
发明人 |
SUEMASU TAKASHI;TOKO KAORU;USAMI NORITAKA;HARA YASUHIRO |
分类号 |
H01L31/0256;H01L21/363;H01L31/0216;H01L31/18 |
主分类号 |
H01L31/0256 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|