发明名称 |
Lithographic Method and Apparatus |
摘要 |
A method of patterning substrates using a lithographic apparatus. The method comprising providing a beam of radiation using an illumination system, using a patterning device to impart the radiation beam with a pattern in its cross-section, and using a projection system to project the patterned radiation beam onto target portions of a lot of substrates, wherein the method further comprises performing a radiation beam aberration measurement after projecting the patterned radiation beam onto a subset of the lot of substrates, performing an adjustment of the projection system using the results of the radiation beam aberration measurement, then projecting the patterned radiation beam onto a further subset of the lot of substrates. |
申请公布号 |
US2015346606(A1) |
申请公布日期 |
2015.12.03 |
申请号 |
US201514825771 |
申请日期 |
2015.08.13 |
申请人 |
ASML Netherlands B.V. |
发明人 |
BASELMANS Johannes Jacobus Matheus;JASPER Johannes Christiaan Maria |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
|
主权项 |
1. A lithographic apparatus comprising:
an illumination system configured to provide a beam of radiation; a support structure configured to support patterning device, the patterning device serving to impart the radiation beam with a pattern in its cross-section; a substrate table configured to hold a substrate; and a projection system configured to project the patterned radiation beam onto a target portion of the substrate; a controller configured to operate the lithographic apparatus. |
地址 |
Veldhoven NL |