METHOD OF COMPENSATING FOR EFFECTS OF MECHANICAL STRESSES IN A MICROCIRCUIT

摘要

A method for manufacturing an integrated circuit includes forming in a substrate a measuring circuit sensitive to mechanical stresses and configured to supply a measurement signal representative of mechanical stresses exerted on the measuring circuit. The measuring circuit is positioned such that the measurement signal is also representative of mechanical stresses exerted on a functional circuit of the integrated circuit. A method of using the integrated circuit includes determining from the measurement signal the value of a parameter of the functional circuit predicted to mitigate an impact of the variation in mechanical stresses on the operation of the functional circuit, and supplying the functional circuit with the determined value of the parameter.

主权项

1. A device, comprising:
a semiconductor substrate; a functional circuit formed in the semiconductor substrate and configured to be variable, with respect to an operating parameter of the functional circuit, in response to variations in a control signal at a control signal input of the functional circuit; and a measuring circuit configured to detect mechanical stresses exerted on the functional circuit, to determine a value of the control signal according to a value of the detected mechanical stresses, and to differentiate between mechanical stresses exerted on the functional circuit along two different axes.