| 发明名称 |
SYSTEM FOR AND METHOD OF SEMICONDUCTOR FAULT DETECTION |
| 摘要 |
A method of detecting one or more faults in a semiconductor device that includes generating a first test pattern set from a primary node list and a fault list. The primary node list includes one or more nodes and the fault list identifies one or more faults. The method also includes generating one or more secondary node lists from the primary node list and generating a second test pattern set from at least the first test pattern set and the secondary node list. Each node of the one or more nodes of the primary node list is associated with a corresponding secondary node list of the one or more secondary node lists. |
| 申请公布号 |
US2015347664(A1) |
申请公布日期 |
2015.12.03 |
| 申请号 |
US201414291286 |
申请日期 |
2014.05.30 |
| 申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
GOEL Sandeep Kumar;LEE Yuan-Han |
| 分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of detecting one or more faults in a semiconductor device, the method comprising:
generating a first test pattern set from a primary node list and a fault list, wherein the primary node list comprises one or more nodes, wherein the fault list identifies the one or more faults; generating one or more secondary node lists from the primary node list, wherein each node of the one or more nodes of the primary node list is associated with a corresponding secondary node list of the one or more secondary node lists; and generating a second test pattern set from at least the first test pattern set and the secondary node list. |
| 地址 |
Hsinchu TW |
