发明名称 SEMICONDUCTOR MEMORY DEVICE WITH POWER INTERRUPTION DETECTION AND RESET CIRCUIT
摘要 A control logic unit generates a control signal which is activated while a power supply normally operates. A charge circuit is connected to a first node on a voltage control line supplied with a voltage generated by a voltage generation circuit, so that its capacitive element is charged with electric charge. A first discharge circuit is connected to a charge storage node of the charge circuit and discharges the stored electric charge when the control signal is activated. A second discharge circuit discharges the first node when the charge storage node has a potential exceeding a predetermined potential.
申请公布号 US2015348641(A1) 申请公布日期 2015.12.03
申请号 US201514826117 申请日期 2015.08.13
申请人 ITO Takashi 发明人 ITO Takashi
分类号 G11C16/30;G11C16/14 主分类号 G11C16/30
代理机构 代理人
主权项 1. A semiconductor device comprising: a plurality of memory cells each storing data depending on a change in level of a threshold voltage; a voltage generation circuit generating a voltage to be applied to said memory cell; a control logic unit generating a control signal activated while a power supply voltage is normally supplied; a charge circuit coupled to a first node on a voltage control line supplied with the voltage generated by said voltage generation circuit, said charge circuit including a second node and a capacitive element coupled to said second node; a first discharge circuit coupled to said second node, and coupling said second node to a ground potential when said control signal is activated; and a second discharge circuit coupling said first node to said ground potential when a voltage of said second node exceeds a threshold voltage value of said second discharge circuit.
地址 Tokyo JP