发明名称 SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND ELECTRONIC DEVICE
摘要 Provided is a semiconductor device that occupies a small area, a highly integrated semiconductor device, or a semiconductor device with high productivity. To fabricate an integrated circuit, a first insulating film is formed over a p-channel transistor; a transistor including an oxide semiconductor is formed over the first insulating film; a second insulating film is formed over the transistor; an opening, that is, a contact hole part of a sidewall of which is formed of the oxide semiconductor of the transistor, is formed in the first insulating film and the second insulating film; and an electrode connecting the p-channel transistor and the transistor including an oxide semiconductor to each other is formed.
申请公布号 US2015348909(A1) 申请公布日期 2015.12.03
申请号 US201514657347 申请日期 2015.03.13
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI Shunpei;MIYAIRI Hidekazu;SASAGAWA Shinya
分类号 H01L23/535;H01L23/528;H01L21/768;H01L23/522 主分类号 H01L23/535
代理机构 代理人
主权项 1. A semiconductor device comprising: a transistor; an insulating film over the transistor, having an opening portion that overlaps with the transistor; and a first conductive film provided in the opening portion, electrically connected to the transistor, wherein a side surface of the first conductive film has a plurality of projections in a cross section in a thickness direction.
地址 Atsugi-shi JP