发明名称 |
SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND ELECTRONIC DEVICE |
摘要 |
Provided is a semiconductor device that occupies a small area, a highly integrated semiconductor device, or a semiconductor device with high productivity. To fabricate an integrated circuit, a first insulating film is formed over a p-channel transistor; a transistor including an oxide semiconductor is formed over the first insulating film; a second insulating film is formed over the transistor; an opening, that is, a contact hole part of a sidewall of which is formed of the oxide semiconductor of the transistor, is formed in the first insulating film and the second insulating film; and an electrode connecting the p-channel transistor and the transistor including an oxide semiconductor to each other is formed. |
申请公布号 |
US2015348909(A1) |
申请公布日期 |
2015.12.03 |
申请号 |
US201514657347 |
申请日期 |
2015.03.13 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
YAMAZAKI Shunpei;MIYAIRI Hidekazu;SASAGAWA Shinya |
分类号 |
H01L23/535;H01L23/528;H01L21/768;H01L23/522 |
主分类号 |
H01L23/535 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a transistor; an insulating film over the transistor, having an opening portion that overlaps with the transistor; and a first conductive film provided in the opening portion, electrically connected to the transistor, wherein a side surface of the first conductive film has a plurality of projections in a cross section in a thickness direction. |
地址 |
Atsugi-shi JP |