| 发明名称 | Conductive structure and method for manufacturing same | ||
| 摘要 | Provided is a conductive structure body comprising: a substrate; a conductive pattern; and a darkened pattern comprising CuOx (0<x≦1), and a method for manufacturing the same. The conductive structure body may prevent reflection due to a conductive pattern without affecting the conductivity of the conductive pattern, and may improve the concealment of the conductive pattern by improving the absorbance of the conductive structure body. Therefore, a display panel with improved visibility may be developed using the conductive structure body. | ||
| 申请公布号 | US9204535(B2) | 申请公布日期 | 2015.12.01 |
| 申请号 | US201314351371 | 申请日期 | 2013.04.18 |
| 申请人 | LG CHEM, LTD. | 发明人 | Lim Jin Hyong;Kim Sujin;Jang Song Ho;Kim Ki-Hwan;Kim Chung Wan |
| 分类号 | G06F3/044;H05K1/02;H01L31/0224;H01B1/02;H01L31/0216;H05K3/10;G06F3/045;C23C14/08;H01L51/44 | 主分类号 | G06F3/044 |
| 代理机构 | Dentons US LLP | 代理人 | Dentons US LLP |
| 主权项 | 1. A conductive structure body comprising: a substrate; a conductive pattern provided on the substrate; and a darkened pattern provided on at least one surface of the conductive pattern and comprising CuOx (0<x≦1), wherein the conductive pattern has a line width of 10 μm or less, the darkened pattern has a thickness from 35 nm to 50 nm, and the conductive structure body has an average refractive index from 2 to 3 and an average extinction coefficient (k) from 0.4 to 1.0 in the visible light region, and wherein a total reflection of the darkened pattern is 20% or less, and wherein the total reflection is a value measured based on a wavelength value of 550 nm in reflection light reflected by the darkened pattern or the conductive structure body to which light is incident when the incident light is defined as 100%. | ||
| 地址 | Seoul KR | ||