| 摘要 |
PROBLEM TO BE SOLVED: To provide a method capable of suppressing reduction of inspection accuracy that is found when implementing a continuous inspection method of electric characteristics of a chip electronic component, without extending an inspection process.SOLUTION: In the continuous inspection method of the electric characteristics of the chip electronic component using a chip electronic component carrier disk with which three or more rows of through-holes are concentrically formed on a surface, an operation is programmed for removing oxide coating generated in distal ends of electrode terminals in contact with another or more chip electronic components by applying a DC current to the electrode terminals while the electric characteristics of one of chip electrode components accommodated in the through-holes neighboring in a radial direction of the disk are measured. |
