| 摘要 |
PROBLEM TO BE SOLVED: To obscure a knitted stitch pattern in a sample, which is included in an image obtained by imaging a knitted dyeing sample or a sample gray fabric, thereby allowing a defect of a knitted fabric to be easily determined.SOLUTION: An apparatus performs image processing on a sample image 9 obtained by imaging a sample surface of a knitted fabric formed of synthetic fiber threads. The apparatus performs knitted stitch reduction processing on the sample image 9, to obscure a knitted stitch pattern of the knitted fabric. |
