发明名称 COMPLEX CIRCUITS UTILIZING FIN STRUCTURES
摘要 A method of forming a semiconductor structure includes forming a multilayer lattice matched structure having an unstrained layer, a first strained layer, and a second strained layer formed between the unstrained and the first strained layer. A first opening in the multilayer structure is etched and a second strained fill material having a same material as the second strained layer is deposited. A second opening in the multilayer structure is etched and an unstrained fill material having a same material as the unstrained layer is deposited. A first strained fill material having a same material as the first strained layer is then deposited between the unstrained fill and the second strained fill. A second strained fin is formed from the deposited second strained fill material, a first strained fin is formed from the deposited first strained fill material, and an unstrained fin is formed from the deposited unstrained fill material.
申请公布号 US2015340364(A1) 申请公布日期 2015.11.26
申请号 US201514805529 申请日期 2015.07.22
申请人 International Business Machines Corporation 发明人 Cheng Kangguo;Doris Bruce B.;Khakifirooz Ali;Rim Kern
分类号 H01L27/088;H01L21/02;H01L21/8234;H01L29/78;H01L29/16 主分类号 H01L27/088
代理机构 代理人
主权项
地址 Armonk NY US