发明名称 偏光解析装置
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a polarization analysis device capable of rotating an analyzer at a fixed rotation speed and also measuring a measurement object in a comparatively short time. <P>SOLUTION: An illumination device 10 irradiates a measurement object 1 with light. Imaging means 20 receives reflection light from the measurement object 1. An analyzer 21 to be rotated by rotation means 22 is arranged between the measurement object 1 and the imaging means 20. An angle sensor 23 detects the rotation angle of the analyzer 21. Trigger means 25 outputs a trigger signal to the illumination device 10 and the imaging means 20 when the angle sensor 23 indicates a prescribed rotation angle, and the illumination device 10 generates flash light during the reception of the reflection light from the measurement object 1 by the imaging means 20. Analysis means 24 analyzes the polarization state of the reflection light through the use of the rotation angle of the analyzer 21 detected by the angle sensor 23 when the illumination device 10 generates the flash light and the intensity of the light received by the imaging means 20. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5821029(B2) 申请公布日期 2015.11.24
申请号 JP20110160963 申请日期 2011.07.22
申请人 发明人
分类号 G01N21/21 主分类号 G01N21/21
代理机构 代理人
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