| 发明名称 |
Method for Image Outlier Removal for Transmission Electron Microscope Cameras |
| 摘要 |
Methods are disclosed for removal of outlier pixels from a transmission electron microscopy camera image. One exemplary method includes establishing a desired exposure of n electrons per pixel; exposing the camera to a series of sub-frame exposures to produce a series of sub-frame images; calculating an average image signal of all sub-frame exposures in said series; establishing a threshold selected to achieve a desired number of false positives; evaluating each of said sub-frame exposures for pixels further away from said average than said threshold; and replacing pixels in each of said sub-frame images that exceed said threshold with said average to form corrected sub-frame images. |
| 申请公布号 |
US2015332892(A1) |
申请公布日期 |
2015.11.19 |
| 申请号 |
US201514814435 |
申请日期 |
2015.07.30 |
| 申请人 |
Mooney Paul |
发明人 |
Mooney Paul |
| 分类号 |
H01J37/26 |
主分类号 |
H01J37/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for removal of outlier pixels from a transmission electron microscopy camera image comprising:
a. establishing a desired exposure of n electrons per pixel; b. exposing the camera to a series of sub-frame exposures to produce a series of sub-frame images; c. calculating an average image signal of all sub-frame exposures in said series; d. establishing a threshold selected to achieve a desired number of false positives; e. evaluating each of said sub-frame exposures for pixels further away from said average than said threshold; and f. replacing pixels in each of said sub-frame images that exceed said threshold with said average to form corrected sub-frame images. |
| 地址 |
Pleasonton CA US |
