发明名称 |
MEASUREMENT APPARATUS AND METHOD OF MEASURING SIGNAL LIGHT QUALITY |
摘要 |
There is provided a measurement apparatus of measuring signal light quality. The measurement apparatus may include: a tunable wavelength filter configured to be input signal lights having different power levels; a measure configured to measure an optical power level of light passing through the tunable wavelength filter; and a controller configured to calculate a non-linear noise component and a spontaneous emission component of a signal light based on the measured optical power levels, the optical power levels being measured at different transmission frequencies for each of the signal lights having the different power levels in response to a control of the transmission frequency of the tunable wavelength filter. |
申请公布号 |
US2015330835(A1) |
申请公布日期 |
2015.11.19 |
申请号 |
US201514687157 |
申请日期 |
2015.04.15 |
申请人 |
FUJITSU LIMITED |
发明人 |
Yamauchi Tomohiro;Oda Shoichiro |
分类号 |
G01J1/44;G01J1/04 |
主分类号 |
G01J1/44 |
代理机构 |
|
代理人 |
|
主权项 |
1. A measurement apparatus of measuring signal light quality, the apparatus comprising:
a tunable wavelength filter configured to be input signal lights having different power levels; a measure configured to measure an optical power level of light passing through the tunable wavelength filter; and a controller configured to calculate a non-linear noise component and a spontaneous emission component of a signal light based on the measured optical power levels, the optical power levels being measured at different transmission frequencies for each of the signal lights having the different power levels in response to a control of the transmission frequency of the tunable wavelength filter. |
地址 |
Kawasaki-shi JP |