发明名称 METHOD FOR MAKING SEMICONDUCTOR DEVICE WITH DIFFERENT FIN SETS
摘要 A method for making a semiconductor device may include forming, above a substrate, first and second semiconductor regions laterally adjacent one another and each including a first semiconductor material. The first semiconductor region may have a greater vertical thickness than the second semiconductor region and define a sidewall with the second semiconductor region. The method may further include forming a spacer above the second semiconductor region and adjacent the sidewall, and forming a third semiconductor region above the second semiconductor region and adjacent the spacer, with the second semiconductor region including a second semiconductor material different than the first semiconductor material. The method may also include removing the spacer and portions of the first semiconductor material beneath the spacer, forming a first set of fins from the first semiconductor region, and forming a second set of fins from the second and third semiconductor regions.
申请公布号 US2015333086(A1) 申请公布日期 2015.11.19
申请号 US201414280998 申请日期 2014.05.19
申请人 STMICROELECTRONICS, INC ;GLOBALFOUNDRIES Inc. ;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LIU Qing;CAI Xiuyu;XIE Ruilong;Yeh Chun-chen;Wang Kejia;Chanemougame Daniel
分类号 H01L27/12;H01L29/66 主分类号 H01L27/12
代理机构 代理人
主权项 1. A method for making a semiconductor device comprising: forming, above a substrate, first and second semiconductor regions laterally adjacent one another and each comprising a first semiconductor material, the first semiconductor region having a greater vertical thickness than the second semiconductor region and defining a sidewall with the second semiconductor region; forming a spacer above the second semiconductor region and adjacent the sidewall; forming a third semiconductor region above the second semiconductor region and adjacent the spacer, the second semiconductor region comprising a second semiconductor material different than the first semiconductor material; removing the spacer and portions of the first semiconductor material beneath the spacer; and forming a first set of fins from the first semiconductor region, and forming a second set of fins from the second and third semiconductor regions.
地址 Coppell TX US
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