发明名称 |
METHOD FOR MAKING SEMICONDUCTOR DEVICE WITH DIFFERENT FIN SETS |
摘要 |
A method for making a semiconductor device may include forming, above a substrate, first and second semiconductor regions laterally adjacent one another and each including a first semiconductor material. The first semiconductor region may have a greater vertical thickness than the second semiconductor region and define a sidewall with the second semiconductor region. The method may further include forming a spacer above the second semiconductor region and adjacent the sidewall, and forming a third semiconductor region above the second semiconductor region and adjacent the spacer, with the second semiconductor region including a second semiconductor material different than the first semiconductor material. The method may also include removing the spacer and portions of the first semiconductor material beneath the spacer, forming a first set of fins from the first semiconductor region, and forming a second set of fins from the second and third semiconductor regions. |
申请公布号 |
US2015333086(A1) |
申请公布日期 |
2015.11.19 |
申请号 |
US201414280998 |
申请日期 |
2014.05.19 |
申请人 |
STMICROELECTRONICS, INC ;GLOBALFOUNDRIES Inc. ;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
LIU Qing;CAI Xiuyu;XIE Ruilong;Yeh Chun-chen;Wang Kejia;Chanemougame Daniel |
分类号 |
H01L27/12;H01L29/66 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
1. A method for making a semiconductor device comprising:
forming, above a substrate, first and second semiconductor regions laterally adjacent one another and each comprising a first semiconductor material, the first semiconductor region having a greater vertical thickness than the second semiconductor region and defining a sidewall with the second semiconductor region; forming a spacer above the second semiconductor region and adjacent the sidewall; forming a third semiconductor region above the second semiconductor region and adjacent the spacer, the second semiconductor region comprising a second semiconductor material different than the first semiconductor material; removing the spacer and portions of the first semiconductor material beneath the spacer; and forming a first set of fins from the first semiconductor region, and forming a second set of fins from the second and third semiconductor regions. |
地址 |
Coppell TX US |