发明名称 MEASUREMENT APPARATUS AND METHOD OF MEASURING SIGNAL LIGHT QUALITY
摘要 There is provided a measurement apparatus of measuring signal light quality. The measurement apparatus may include: a tunable wavelength filter (21) configured to be input signal lights having different power levels; a measure (20) configured to measure an optical power level of light passing through the tunable wavelength filter (21); and a controller (23) configured to calculate a non-linear noise component and a spontaneous emission component of a signal light based on the measured optical power levels, the optical power levels being measured at different transmission frequencies for each of the signal lights having the different power levels in response to a control of the transmission frequency of the tunable wavelength filter (21).
申请公布号 EP2945301(A1) 申请公布日期 2015.11.18
申请号 EP20150164825 申请日期 2015.04.23
申请人 FUJITSU LIMITED 发明人 YAMAUCHI, TOMOHIRO;ODA, SHOICHIRO
分类号 H04B10/079 主分类号 H04B10/079
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