发明名称 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION AND PATTERNING PROCESS
摘要 The present invention relates to a chemically amplified negative resist composition having a mechanism for performing cross-linking between resist polymers and insolubilizing an alkaline developing solution, by a crosslinking agent and/or a repeating unit having a crosslinkable functional group among resist polymers while having an acid generated by irradiation with high energy beams as a catalyst. The resist polymers contain repeating units of chemical formulas (1) to (4), and a repeating unit represented by chemical formula (1) includes 0.5 to 10 mole%. In addition, a ratio of the total amount of repeating units represented by chemical formulas (2) to (4) includes 50 to 99.5 mole%. According to the present invention, fine distribution and diffusion of a compound having an ability of generating an acid in a resist film can be more uniform, and effective sensitivity can be advantageously obtained. In addition, line edge roughness can be improved; deactivation of an acid on a substrate interface can be suppressed; and a resist profile with a small undercut degree specific to a negative resist composition can be formed.
申请公布号 KR20150127771(A) 申请公布日期 2015.11.18
申请号 KR20120019457 申请日期 2012.02.27
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 MASUNAGA KEIICHI;DOMON DAISUKE;WATANABE SATOSHI
分类号 G03F7/038;G03F7/004;G03F7/26 主分类号 G03F7/038
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