发明名称 Method and device for adjusting the bias voltage of a SPAD photodiode
摘要 The present disclosure relates to a method for adjusting a bias voltage of a SPAD photodiode, comprising successive steps of: applying to the photodiode a first test bias voltage lower than a normal bias voltage applied to the photodiode in a normal operating mode, subjecting the photodiode to photons, reading a first avalanche triggering signal of the photodiode, applying to the photodiode a second test bias voltage, different from the first test bias voltage, subjecting the photodiode to photons, reading a second avalanche triggering signal of the photodiode, increasing the normal bias voltage if the first and second signals indicate that the photodiode did not avalanche trigger, and reducing the normal bias voltage if the first and second signals indicate that the photodiode did avalanche trigger.
申请公布号 US9190552(B2) 申请公布日期 2015.11.17
申请号 US201313896219 申请日期 2013.05.16
申请人 STMicroelectronics (Grenoble 2) SAS 发明人 Brunel John;Tubert Cedric
分类号 G01J1/44;H01L31/107;H01L31/02 主分类号 G01J1/44
代理机构 Seed IP Law Group PLLC 代理人 Seed IP Law Group PLLC
主权项 1. A method, comprising: adjusting a bias voltage of a first single-photon avalanche photodiode (SPAD), the adjusting including: applying to the first photodiode a first test bias voltage lower than a normal bias voltage applied to the first photodiode in a normal operating mode;subjecting the first photodiode to photons;reading a first avalanche triggering signal of the first photodiode;applying to the first photodiode a second test bias voltage, different from the first test bias voltage;subjecting the first photodiode to photons;reading a second avalanche triggering signal of the first photodiode;determining if the first photodiode triggered avalanche by analyzing the first and second triggering signals;increasing the normal bias voltage if the first photodiode did not trigger avalanche; andreducing the normal bias voltage if the first photodiode did trigger avalanche in response to both the first and second test bias voltages.
地址 Grenoble FR