发明名称 Methods and systems for sequential feature selection based on significance testing
摘要 Systems and methods for determining a reduced feature set for a model for classifying data are disclosed. In some embodiments, the method includes obtaining a first feature set for the model. The method may also include selecting a second feature set for the model, wherein the second feature set is a candidate for the reduced feature set. In some embodiments, the second feature set is a subset or a superset of the first feature set. In some embodiments, the selection includes applying a selection statistical test. The method may further include determining whether the model using the second feature set in place of the first feature set is adequate for classifying the data. In some embodiments, the determination includes applying an evaluation statistical test.
申请公布号 US9189750(B1) 申请公布日期 2015.11.17
申请号 US201313843854 申请日期 2013.03.15
申请人 The MathWorks, Inc. 发明人 Narsky Ilya
分类号 G06F15/18;G06N99/00 主分类号 G06F15/18
代理机构 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP 代理人 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
主权项 1. A method for determining, by one or more processors, a reduced feature set for a model for classifying data, the method comprising: obtaining a first feature set for the model; selecting a second feature set for the model, wherein the second feature set is a subset of the first feature set and is a candidate for the reduced feature set, the selecting comprising applying a selection statistical test by the one or more processors; and determining whether the model using the second feature set in place of the first feature set is adequate for classifying the data, the determining comprising applying an evaluation statistical test by the one or more processors.
地址 Natick MA US