Angle-dependent X-ray diffraction imaging system and method of operating the same

摘要

An x-ray diffraction imaging (XDI) system having a system axis includes at least one x-ray source configured to generate x-rays directed toward an object that includes at least one substance. The at least one x-ray source is further configured to irradiate at least one voxel defined within the object with x-rays arriving from a plurality of directions, each direction defined by an angle of incidence with respect to the system axis. The system also includes at least one detector configured to detect scattered x-rays after the x-rays have passed through the object. The system further includes at least one processor coupled to the at least one detector. The processor is programmed to generate a plurality of XDI profiles of the object voxel. Each XDI profile is a function of an associated angle of incidence.

主权项

1. An x-ray diffraction imaging (XDI) system having a system axis, said system comprising:
at least one x-ray source configured to generate x-rays directed toward an object that includes at least one substance, wherein said at least one x-ray source is further configured to irradiate at least one voxel defined within the object with x-rays arriving from a plurality of directions, each direction defined by an angle of incidence with respect to the system axis; at least one detector configured to detect scattered x-rays after the x-rays have passed through the object; and at least one processor coupled to said at least one detector, said at least one processor programmed to generate a plurality of XDI profiles of the object voxel, wherein each XDI profile is a function of an associated angle of incidence.