发明名称 Nonvolatile memory device and method of operating the same
摘要 Provided are a nonvolatile memory device and a method for operating the nonvolatile memory device. The method for operating the nonvolatile memory device includes generating a first program voltage, applying the generated first program voltage to a first word line to which a first memory cell is connected for performing a first program operation on the first memory cell, determining whether a number of pulses of a pumping clock signal for generating the first program voltage is greater than or equal to a predetermined critical value n (where n is a natural number), and stopping the performing of the first program operation on the first memory cell when the number of pulses of the pumping clock signal is determined to be greater than or equal to the predetermined critical value n.
申请公布号 US9189174(B2) 申请公布日期 2015.11.17
申请号 US201313904047 申请日期 2013.05.29
申请人 Samsung Electronics Co., Ltd. 发明人 Lee Han-Jun;Byeon Dae-Seok
分类号 G11C16/04;G06F3/06;G11C16/30;G11C16/12;G11C5/14 主分类号 G11C16/04
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A method of operating a nonvolatile memory device, the method comprising: applying a pumping clock signal to a charge pumping unit to generate a first program voltage; applying the generated first program voltage to a first word line to which a first memory cell is connected for performing a first program operation on the first memory cell; determining whether a number of pulses of the pumping clock signal applied to the charge pumping unit to generate the first program voltage is greater than or equal to a predetermined critical value n, where n is a natural number; and stopping the performing of the first program operation on the first memory cell when the number of pulses of the pumping clock signal is determined to be greater than or equal to the predetermined critical value n.
地址 Suwon-si, Gyeonggi-do KR