发明名称 |
PROCEDE DE CARACTERISATION D'UN PROCEDE DE FABRICATION DE TRANSISTORS MOS |
摘要 |
A method is provided for controlling a sample and hold circuit that includes a switching module coupled to a storage capacitor. A circuit external to the sample and hold circuit of generates at least one main current representative of at least one leakage current of the switching module in its off state. The at least one main current is delivered to at least one auxiliary capacitor. An initial pulse signal is generated from the charging and discharging of the at least one auxiliary capacitor. The sampling phase of the sample and hold circuit is triggered at the rate of the pulses of a pulse signal derived from the initial pulse signal. |
申请公布号 |
FR3014267(B1) |
申请公布日期 |
2015.11.13 |
申请号 |
FR20140055591 |
申请日期 |
2014.06.18 |
申请人 |
STMICROELECTRONICS (ROUSSET) SAS |
发明人 |
GAILHARD BRUNO;JOLY YOHAN |
分类号 |
H03K19/0185;H03M1/12 |
主分类号 |
H03K19/0185 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|