发明名称 |
WAFER LEVEL PACKAGED INFRARED (IR) FOCAL PLANE ARRAY (FPA) WITH EVANESCENT WAVE COUPLING |
摘要 |
A structure for detecting electromagnetic radiation having a predetermined wavelength. The structure includes a device wafer having a sensing element disposed on a predetermined region of a surface of the device wafer responsive to the electromagnetic radiation. A cover wafer is provided having a region thereof transparent to the electromagnetic radiation for passing the electromagnetic radiation through the transparent region onto a surface of the sensing element. A bond gap spacer structure is provided for supporting the surface of the sensing element from an opposing surface of the transparent region of the cover wafer a distance less than a fraction of the predetermined wavelength when. the cover wafer is bonded to the device wafer. |
申请公布号 |
US2015321905(A1) |
申请公布日期 |
2015.11.12 |
申请号 |
US201414270945 |
申请日期 |
2014.05.06 |
申请人 |
Raytheon Company |
发明人 |
Gooch Roland W.;Black Stephen H.;Kocian Thomas A.;Kennedy Adam M.;Diep Buu Q. |
分类号 |
B81B7/00;H01L37/00 |
主分类号 |
B81B7/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A structure for detecting electromagnetic radiation having a predetermined wavelength, comprising:
a device wafer having a sensing element disposed on a predetermined region of a surface of the device wafer responsive to the electromagnetic radiation; a cover wafer having a region thereof transparent to the electromagnetic radiation for passing the electromagnetic radiation through the transparent region onto a surface of the sensing element; a bond gap spacer structure for supporting the surface of the sensing element from an opposing surface of the transparent region of the cover wafer a predetermined distance less than a fraction of the predetermined wavelength when the cover wafer is bonded to the device wafer. |
地址 |
Waltham MA US |