发明名称 Semiconductor Devices and Methods of Forming Thereof
摘要 In accordance with an embodiment of the present invention, a method of forming a semiconductor device includes forming a sacrificial layer over a first surface of a workpiece having the first surface and an opposite second surface. A membrane is formed over the sacrificial layer. A through hole is etched through the workpiece from the second surface to expose a surface of the sacrificial layer. At least a portion of the sacrificial layer is removed from the second surface to form a cavity under the membrane. The cavity is aligned with the membrane.
申请公布号 US2015321901(A1) 申请公布日期 2015.11.12
申请号 US201514798112 申请日期 2015.07.13
申请人 Infineon Technologies AG 发明人 Dehe Alfons;Ahrens Carsten;Barzen Stefan;Friza Wolfgang
分类号 B81B3/00 主分类号 B81B3/00
代理机构 代理人
主权项 1. A semiconductor device comprising: a first cavity disposed in a substrate having a first surface and an opposite second surface, the first cavity extending from a first surface into a substrate; a second cavity disposed in the substrate, the second cavity extending from the second surface to the first cavity to form a continuous cavity, wherein the first cavity comprises a first center point, wherein the second cavity comprises a second center point, wherein the first cavity at least partially overlaps the second cavity; and a moveable membrane layer disposed over the second surface of the substrate, wherein a moveable portion of the moveable membrane layer comprises a third center point, wherein the third center point and the second center point are aligned.
地址 Neubiberg DE
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