| 摘要 |
An optical measuring apparatus comprising at least one light emitting unit, a stage, at least one lens, and at least one light detector is provided. The light emitting unit emits a light beam. The stage contains accommodating spaces. The accommodating spaces move to the transmission path of the light beam in turn. The lens is located between the light emitting unit and the stage, whose orthogonal projection on the stage appears substantially to be a polygon. When one of the accommodating spaces moves to the transmission path of the light beam, a perpendicular bisector half line of each side of the polygon is not overlapped with another adjacent accommodating space of the accommodating spaces. An optical measuring method is also provided. |
| 主权项 |
1. An optical measuring apparatus adapted to measure at least one sample, the optical measuring apparatus comprising:
at least one light emitting unit, configured to emit a light beam; a stage, disposed on a transmission path of the light beam, and comprising a plurality of accommodating spaces, wherein the accommodating spaces accommodate the sample respectively, and the accommodating spaces move to the transmission path of the light beam in turn; at least one lens, disposed on the transmission path of the light beam and located between the light emitting unit and the stage, and an orthogonal projection of the lens on the stage appearing to be a polygon, wherein when one of the accommodating spaces moves to the transmission path of the light beam, a perpendicular bisector half line of each side of the polygon is not overlapped with another adjacent accommodating space of the accommodating spaces, wherein the perpendicular bisector half line is taken a midpoint of the side of the polygon as a starting point, and is the line extending along the perpendicular bisector half line of the side away from the polygon; and at least one light detector, disposed on the transmission path of the light beam from the stage, so as to detect the light beam. |
