发明名称 Devices and methods for calibrating and operating a snapback clamp circuit
摘要 A device includes a snapback clamp circuit configured to clamp a supply voltage in response to the supply voltage exceeding a trigger voltage level. In at least one embodiment, the snapback clamp circuit includes a clamp transistor and a programmable resistance portion that is responsive to a control signal to calibrate the trigger voltage level. Alternatively or in addition, the snapback clamp circuit may include a programmable bias device configured to calibrate the trigger voltage level by biasing a gate terminal of the clamp transistor. In another particular embodiment, a method of calibrating a snapback clamp circuit is disclosed. In another particular embodiment, a method of operating an integrated circuit is disclosed.
申请公布号 US9182767(B2) 申请公布日期 2015.11.10
申请号 US201313794268 申请日期 2013.03.11
申请人 QUALCOMM INCORPORATED 发明人 Srivastava Ankit;Sienko Matthew David;Worley Eugene Robert
分类号 H02H9/00;G05F1/10;H01L27/02;H01L27/06;H02H9/04;H02H3/00 主分类号 H02H9/00
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A device comprising: a snapback clamp circuit configured to clamp a supply voltage in response to the supply voltage exceeding a trigger voltage level, wherein the snapback clamp circuit includes a clamp transistor and a programmable resistance portion configured to adjust a body-to-ground resistance of the clamp transistor and responsive to a control signal to calibrate the trigger voltage level.
地址 San Diego CA US