发明名称 Test patterns for print heads having two image sources
摘要 A method is described that entails printing a series of test patterns. Each test pattern has its own respective set of outer lines and set of inner lines. The series of test patterns have a different intended spacing between their respective inner lines and outer lines. The intended spacing of each test pattern is printed in a manner that correlates the intended spacing of each test pattern with its test pattern. Each of the outer lines are printed with a first print source and each of the inner lines printed with a second print source. Inner lines of a first set of the test patterns are shorter than inner lines of a second set of the test patterns to enhance resolution at which differences in the spacings between respective inner and outer lines of same test patterns are able to be detected across different test patterns.
申请公布号 US9180712(B1) 申请公布日期 2015.11.10
申请号 US201414485357 申请日期 2014.09.12
申请人 Ricoh Company, LTD. 发明人 Stanich Mikel John;Chandu Kartheek;Ernst Larry M.
分类号 B41J29/393;B41J2/045 主分类号 B41J29/393
代理机构 Blakely, Sokoloff, Taylor & Zafman LLP 代理人 Blakely, Sokoloff, Taylor & Zafman LLP
主权项 1. A method, comprising: printing a series of test patterns, each test pattern having its own respective set of outer lines and set of inner lines, the series of test patterns having a different spacing between respective inner lines and outer lines, the spacing of each test pattern being printed in a manner that correlates the spacing of each test pattern with an associated test pattern, each of the outer lines printed with a first print source and each of the inner lines printed with a second print source, wherein inner lines of a first set of the test patterns are shorter than inner lines of a second set of the test patterns to enhance resolution at which differences in the spacing between respective inner and outer lines of same test patterns are able to be detected across different test patterns.
地址 Tokyo JP