| 发明名称 | Method of searching for parameterized contours for comparing irises | ||
| 摘要 | A method for detecting outlines for iris comparison comprises a step of selecting N candidate outlines of circular form by applying a circle search technique to an image of edges of an iris. It also comprises a step of optimizing the form and the position of the N candidate outlines, the optimized candidate outlines being determined by using parametric models, a set of parameters being determined for each candidate outline by minimizing a quantity of energy E(C). The method also comprises a step of selecting the best optimized candidate outline. | ||
| 申请公布号 | US9183439(B2) | 申请公布日期 | 2015.11.10 |
| 申请号 | US201214118874 | 申请日期 | 2012.05.11 |
| 申请人 | Thales | 发明人 | Lefebvre Thierry;Lempriere Nadege;Garcia Sonia;Dorizzi Bernadette |
| 分类号 | G06K9/00;G06T7/00 | 主分类号 | G06K9/00 |
| 代理机构 | Baker Hostetler LLP | 代理人 | Baker Hostetler LLP |
| 主权项 | 1. A method for detecting outlines for iris comparison, comprising: selecting N candidate outlines of circular form by applying a circle search technique to an image of edges of an iris, optimizing the form and the position of the N candidate outlines, the optimized candidate outlines being determined by using parametric models, a set of parameters being determined for each candidate outline by minimizing a quantity of energy E(C), selecting the best optimized candidate outline wherein the quantity of energy E(C) associated with a candidate outline C is equal to the sum of the edge energy Eedge(C) and of the region energy Eregion(C) of said outline. | ||
| 地址 | FR | ||