OSCILLATION CIRCUIT, MEASURING DEVICE, SEMICONDUCTOR DEVICE, ELECTRO-OPTIC DEVICE AND ELECTRONIC APPARATUS

摘要

PROBLEM TO BE SOLVED: To provide a measuring device which achieves high reliability in measuring.SOLUTION: An oscillation circuit OC includes a first delay circuit DC1, a second delay circuit DC2 and the odd number of inverter circuits. In the first delay circuit DC1, a first transition time where an output changes from a first logic to a second logic is longer than a second transition time where the output changes from the second logic to the first logic. In the second delay circuit DC2, a third transition time where the output changes from a third logic to a fourth logic is longer than a fourth transition time where the output changes from the fourth logic to the third logic. The change of the output in the first delay circuit DC1 from the first logic to the second logic causes the change of the output in the second delay circuit DC2 from the third logic to the fourth logic. In addition, the change of the output in the second delay circuit DC2 from the third logic to the fourth logic causes the change of the output in the first delay circuit DC1 from the second logic to the first logic.