发明名称 DEBUGGING SYSTEM AND METHOD
摘要 A method, computer program product, and computing system for defining a first group of transient values for a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform. A monitoring subsystem is electrically coupled to the first group of conductive paths. A first group of signals present on the first group of conductive paths is monitored while executing at least a portion of an automated test process on the automated test platform to determine if any of the first group of signals exceeds any of the first group of transient values.
申请公布号 US2015316611(A1) 申请公布日期 2015.11.05
申请号 US201514701997 申请日期 2015.05.01
申请人 XCERRA CORPORATION 发明人 PETROV TODOR K.;HARRISON IAN
分类号 G01R31/3177 主分类号 G01R31/3177
代理机构 代理人
主权项 1. A computer-implemented method, executed on a computing device, the computer-implemented method comprising: defining a first group of transient values for a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform; electrically coupling a monitoring subsystem to the first group of conductive paths; and monitoring a first group of signals present on the first group of conductive paths while executing at least a portion of an automated test process on the automated test platform to determine if any of the first group of signals exceeds any of the first group of transient values.
地址 NORWOOD MA US