| 发明名称 | Systems and methods for monitoring rotary equipment | ||
| 摘要 | A system includes a first unitary measurement strip configured to be secured about a rotational component at a first axial location. The first unitary measurement strip includes a first set of one or more windows, each window of the first set of one or more windows is configured to correspond to a first respective tangential location of the rotational component at the first axial location, and each window of the first set of one or more windows is configured to be detectable via a first sensor. | ||
| 申请公布号 | US9176024(B2) | 申请公布日期 | 2015.11.03 |
| 申请号 | US201314061650 | 申请日期 | 2013.10.23 |
| 申请人 | General Electric Company | 发明人 | Jensen Raymond Verle;Hatch Charles Terrance;Summers Sean Kelly |
| 分类号 | G01M15/14;G01L3/12;G01L3/10;G01L3/14;G01M1/16;G01P3/49 | 主分类号 | G01M15/14 |
| 代理机构 | Fletcher Yoder P.C. | 代理人 | Fletcher Yoder P.C. |
| 主权项 | 1. A system comprising: a first unitary measurement strip configured to be attached about a rotational component at a first axial location, the first unitary measurement strip having a first thickness, wherein the first unitary measurement strip comprises a first set of one or more windows formed in the first unitary measurement strip prior to attachment to the rotational component, each window of the first set of one or more windows is configured to correspond to a first respective tangential location of the rotational component at the first axial location, wherein each window of the first set of windows comprises a recess through an entirety of the first thickness of the first unitary measurement strip, and each window of the first set of one or more windows is configured to be detectable via a first non-optical sensor. | ||
| 地址 | Schenectady NY US | ||