发明名称 |
Method and apparatus that facilitates determining refractive error |
摘要 |
Aspects are disclosed for determining refractive error. In an aspect, a line pattern is displayed to a user, and a distance between the line pattern and the user is ascertained. The line pattern includes a first and second line in which an aspect of the line pattern is varied, and where refractive error is quantified based on the distance and a selected variance of the line pattern. In another aspect, the varied aspect of the line is at least one of a width between the first and second line, a thickness of the first or second line, a darkness of the first line or the second line, or a color of the first line or the second line. An input corresponding to a focused line pattern variance selected by the user is then received, and a refractive error is quantified based on the input and an approximate distance between the line pattern and the user. |
申请公布号 |
US9173557(B2) |
申请公布日期 |
2015.11.03 |
申请号 |
US201313937105 |
申请日期 |
2013.07.08 |
申请人 |
|
发明人 |
Clark Jack |
分类号 |
A61B3/02;A61B3/00;A61B3/032;A61B3/036 |
主分类号 |
A61B3/02 |
代理机构 |
Loza & Loza, LLP |
代理人 |
Castro Daniel S.;Loza & Loza, LLP |
主权项 |
1. A method comprising:
displaying a line pattern to a user, the line pattern including a first line and a second line; ascertaining a distance between the line pattern and the user; varying an aspect of the line pattern, the aspect being at least one of a width between the first line and the second line, a thickness of the first line or the second line, a darkness of the first line or the second line, or a color of the first line or the second line; and quantifying a refractive error of the user based on the distance and a selected variance of the line pattern, the selected variance corresponding to a particular aspect variance of the line pattern identified by the user, and the quantifying further comprising accessing a lookup table, wherein the lookup table associates a particular refractive error value to each of a plurality of line pattern aspect combinations. |
地址 |
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