发明名称 THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES AND METHODS OF FABRICATING THE SAME
摘要 Three-dimensional semiconductor memory devices and methods of fabricating the same. The three-dimensional semiconductor devices include an electrode structure with sequentially-stacked electrodes disposed on a substrate, semiconductor patterns penetrating the electrode structure, and memory elements including a first pattern and a second pattern interposed between the semiconductor patterns and the electrode structure, the first pattern vertically extending to cross the electrodes and the second pattern horizontally extending to cross the semiconductor patterns.
申请公布号 US2015311301(A1) 申请公布日期 2015.10.29
申请号 US201514796569 申请日期 2015.07.10
申请人 Seol Kwang Soo;Park Chanjin;Hwang Kihyun;Choi Hanmei;Hur Sunghoi;Hwang Wansik;Nakanishi Toshiro;Park Kwangmin;Lee Juyul 发明人 Seol Kwang Soo;Park Chanjin;Hwang Kihyun;Choi Hanmei;Hur Sunghoi;Hwang Wansik;Nakanishi Toshiro;Park Kwangmin;Lee Juyul
分类号 H01L29/423;H01L27/115;H01L29/51;H01L29/792 主分类号 H01L29/423
代理机构 代理人
主权项 1. A semiconductor memory device comprising: a plurality of stacked structures comprising a plurality of electrodes and insulating patterns that are stacked alternately and repeatedly on a substrate; a plurality of semiconductor patterns penetrating the stacked structures; an electrode isolation pattern between the stacked structures; a tunneling layer and a charge storage layer extending between the electrodes and one of the semiconductor patterns and extending between the insulating patterns and the one of semiconductor patterns; and a blocking layer extending between the electrodes and the one of the semiconductor patterns and extending between the insulating patterns and the electrode isolation pattern.
地址 Yongin-si KR