发明名称 |
Multiple Rate Signature Test to Verify Integrated Circuit Identity |
摘要 |
Screening a batch of integrated circuits (IC) may be done with test patterns provided in a sequence of test vectors. The sequence of test vectors may be fetched from a memory coupled to a tester and then one or more bits from each test vector may be provided to the tester. A test pattern is formed by updating a latch in a periodic manner with a bit value from a same bit position from each of the sequence of test vectors. The test pattern may then be applied to an input pin of a device under test and a resulting signal may be monitored on an output pin of each one of the batch of ICs. A slow speed ICs may be screened by treating each IC that passes both a fast pattern test and a slow speed pattern test as a failure, for example. |
申请公布号 |
US2015309111(A1) |
申请公布日期 |
2015.10.29 |
申请号 |
US201414262778 |
申请日期 |
2014.04.27 |
申请人 |
Texas Instruments Incorporated |
发明人 |
Seah Soy Ying;Patel Gunvant |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
|
主权项 |
1. A method for screening a plurality of integrated circuits (IC), the method comprising:
fetching a sequence of test vectors from a memory coupled to a tester; providing one or more bits from each test vector to the tester; forming a test pattern by updating a latch in a periodic manner with a bit value from a same bit position from each of the sequence of test vectors; and applying the test pattern to an input pin and monitoring a resulting signal on an output pin of each one of the plurality of ICs. |
地址 |
Dallas TX US |