Orientation imaging using wide angle convergent beam diffraction in transmission electron microscopy

摘要

Methods of orientation imaging microscopy (OIM) techniques generally performed using transmission electron microscopy (TEM) for nanomaterials using dynamical theory is presented. Methods disclosed may use a wide angle convergent beam electron diffraction for performing OIM by generating a diffraction pattern having at least three diffraction discs that may provide additional information that is not available otherwise.

主权项

1. A method for orientation imaging microscopy, the method comprising:
providing a specimen having a plurality of grains in a plurality of orientations; obtaining information related to the grains of the specimen using transmission electron microscopy, the information including at least three diffraction discs; determining the center of a first diffraction disc of the at least three diffraction discs; processing the information related to the grains for the first diffraction disc; determining the center of a second diffraction disc of the at least three diffraction discs by excluding the information related to the first diffraction disc; and calculating the grain orientations of the plurality of grains of the specimen.